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Industrial
Temperature Support
Manufacturers of VLSI components are
usually don't rate them for -40° to +85° C range, mainly
because market demand is low. Certification tests are therefore
performed by CompuLab. Most of tested components are found
compatible, while component types showing temperature
sensitivity are replaced by
non-sensitive counterparts.
Small components, such as capacitors,
resistors, oscillators, as well as small integrated circuits used in
CompuLab's boards are usually rated by manufacturers for wide
temperature range.
The cards' testing
method depends on the selected temperature range:
|
Range |
Temp* |
Description |
|
Commercial |
0o to 70o C |
Sample cards from each batch are tested at the lower and
upper temperature limits. Individual cards are not tested for
temperature compliance. |
|
Extended |
-20o to 70o C |
Every card undergoes powerup
and short built-in test for the lower limit
(-20o C) qualification.
Extended temperature certification is available for all card's
configurations.
|
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Industrial |
-40o to 85o C |
Using
dedicated test suit, every card is extensively tested at lower and upper
temperature limits and at several midpoints. Most of on-board
peripherals are covered by the test.
Industrial temperature certification is available only for
card's in the same configuration as kept in stock. |
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| * |
Temperature as measured on the hottest spot of
the card or
heatsink (if it has one) |
Test Coverage
The test is performed under Linux operating
system. Tested features:
- CPU
- SDRAM
- Flash Disk
- Serial Port(s)
- Graphics controller
- Ethernet
- CardBus and PCMCIA, with ATA card
- USB
- Sound
* Tested features can vary according to card's
type.
Industrial Temp Certification Procedure
- Programming the card with industrial temp test suit.
- Cooling without power, at least 20 min
while test chamber is set to -48° C.
- Power up / power down test, 10 cycles.
- Testing of listed above features, using
dedicated test suit.
- Drying the card.
- Heat up to maximum temperature limit.
- Power up / power down test, 10 cycles, on
upper temperature limit.
- Testing of listed above features, using
dedicated test suit.
- Reprogramming the card in functional tester
back to standard contents.
- Running functional ATP at room
temperature.
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